Author:
Katsanos A.,Hadjiantoniou A.
Cited by
18 articles.
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1. An external-beam charged-particle (alpha) activation system for direct trace element analysis in liquids;Measurement Science and Technology;1991-07-01
2. External micro-ion-beam analysis (X-MIBA);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-03
3. Quality control by PEXE of Al/Si alloys;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1987-08
4. Trace elements in skin epitheliomas;Journal of Radioanalytical and Nuclear Chemistry Articles;1987-01
5. Exposure evaluation of dosimetric films by PIXE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1985-06