External micro-ion-beam analysis (X-MIBA)-Reference-Cited by-同舟云学术

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External micro-ion-beam analysis (X-MIBA)

Published:1991-03 Issue:1-3 Volume:54 Page:244-257
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Doyle B.L.,Walsh D.S.,Lee S.R.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference52 articles.

1. X-ray analysis: Elemental trace analysis at the 10−12 g level

2. Proc. 3rd Conf. on Applications of Small Accelerators;Jolly,1974

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