A plasma ion source with plane beam profile for UHV-SIMS measurements
Author:
Publisher
Elsevier BV
Subject
General Medicine
Reference16 articles.
1. Investigation of monolayers by secondary ion mass spectroscopy (SIMS)
2. Developments in secondary ion mass spectroscopy and applications to surface studies
3. M. v. Ardenne, Tabellen zur angewandten Physik, vol. 1.
4. A Magnetic Ion Source
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Pressure dependence of secondary ion emission from selected 3d, 4d, and 5d transition metals under N 2 O, NO, and NO 2;Fresenius' Journal of Analytical Chemistry;1998-10-05
2. Emission of secondary ions from 3d, 4d, and 5d transition metals under chloro-trifluoro-methane CClF 3 as reactant gas;Fresenius' Journal of Analytical Chemistry;1998-07-06
3. A boundary for reaction mechanisms within the transition metals interacting with nitrogen oxides is observed in DSIMS experiments;Fresenius' Journal of Analytical Chemistry;1993
4. Pressure dependence of secondary ion emission from selected transition metals under nitrogen dioxide;Mikrochimica Acta;1991-09
5. Influence of the primary ion incidence angle on secondary ion emission in SIMS with nitric oxide as reactant gas;Fresenius' Journal of Analytical Chemistry;1991
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