Investigation of monolayers by secondary ion mass spectroscopy (SIMS)-Reference-Cited by-同舟云学术

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Investigation of monolayers by secondary ion mass spectroscopy (SIMS)

Published:1979-07 Issue:1-2 Volume:31 Page:151-160
ISSN:0020-7381
Container-title:International Journal of Mass Spectrometry and Ion Physics
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Physics

Author:

Klöppel K.D.,Seidel W.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference12 articles.

1. Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemission

2. Developments in secondary ion mass spectroscopy and applications to surface studies

3. High Efficiency Low‐Pressure Ion Source

4. Investigations on a magnetic ion source, I

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pressure dependence of secondary ion emission from selected transition metals under nitrogen dioxide;Mikrochimica Acta;1991-09

2. Influence of the primary ion incidence angle on secondary ion emission in SIMS with nitric oxide as reactant gas;Fresenius' Journal of Analytical Chemistry;1991

3. Emission of secondary ions from osmium under oxygen and the nitrogen oxides N2O, NO and NO2;Fresenius' Journal of Analytical Chemistry;1991

4. Investigations on the Reactant Gas Pressure Dependence of Sputtering Yields of Several Transition Metals;Berichte der Bunsengesellschaft für physikalische Chemie;1991-01

5. Particle-Induced Desorption Ionization Techniques for Organic Mass Spectrometry;Ion Spectroscopies for Surface Analysis;1991

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