Proton-induced X-ray emission analysis of thick and thin targets
Author:
Publisher
Elsevier BV
Subject
General Medicine
Reference13 articles.
1. X-ray analysis: Elemental trace analysis at the 10−12 g level
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3. The destruction of organic matter;Gorsuch,1970
4. Quantitative trace element analyses in thick samples with heavy‐ion‐induced x‐ray fluorescence
5. Elimination of charging in the proton-induced x-ray emission analysis of insulating samples
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1. Composition of (Bi2S3)1-x(CdS)x Semiconductor Thin Films by Proton Induced X-Ray Emission and Helium Backscattering;Solid State Phenomena;1997-08
2. The effects of surface roughness and tilt upon the quantification of elemental distributions across thick biological sections by proton induced X-ray emission analysis;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1994-12
3. A microstratigraphic investigation of iron ion migration in some ancient Egyptian wall paintings using PIXE Analysis;Canadian Journal of Chemistry;1991-02-01
4. Uses of PIXE at low proton energies;Applied Surface Science;1990-09
5. Deuteron excitation as an alternative in PIXE analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04
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