Author:
Mitchell I.V.,Barfoot K.M.,Eschbach H.L.
Cited by
24 articles.
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1. Bronze analysis by k0-NAA and PIXE;Journal of Radioanalytical and Nuclear Chemistry;2003-09
2. Ion beam analysis with external beams: Recent set-up improvements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-04
3. Low current charge normalization with scintillators;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
4. RBS control of the proton fluence in external PIXE analysis using a He atmosphere;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
5. Bismuth-Implanted Silicon Reference Material Revisited: The Concept of Traceability and the Individual Characterisation of Chips;Application of Particle and Laser Beams in Materials Technology;1995