The (pX, X) experiment — A new approach for partial sensitivity enhancement in trace element analysis
Author:
Publisher
Elsevier BV
Subject
General Medicine
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2. Review of accelerator gadgets for art and archaeology;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-11
3. Chapter 5 Ion beam microanalysis;Non-Destructive Microanalysis of Cultural Heritage Materials;2004
4. High Resolution Energy Dispersive Spectrometry with Charge-Induced X-Rays: Principles, Comparison with Other Methods, and Possible Applications;Journal of Chemical Education;1996-06
5. A guiding principle to select PIXE or PIXE-induced XRF for steel analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
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