The application of high-resolution Rutherford backscattering techniques to near-surface analysis-Reference-Cited by-同舟云学术

The application of high-resolution Rutherford backscattering techniques to near-surface analysis

Author:

Williams J.S.

Publisher

Elsevier BV

Subject

General Medicine

Reference47 articles.

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3. Proc. 2nd Int. Conf. on Ion beam surface layer analysis;Feuerstein,1976

4. Proc. 2nd Int. Conf. on Ion beam surface layer analysis;Williams,1976

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