Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method-Reference-Cited by-同舟云学术

Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method

Published:2000-11 Issue:1 Volume:30 Page:55-63
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Ymeri Hasan,Nauwelaers Bart,Maex Karen

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference10 articles.

1. H. Ymeri, B. Nauwelaers, K. Maex, Fast and accurate analysis of multiconductor interconnects, Proceedings of the European Workshop Materials for Advanced Metallization (MAM 2000), 28 February–1 March 2000, Stresa, Italy, 142–143.

2. H. Ymeri, B. Nauwelaers, K. Maex, Analysis of coupled interconnect transmission lines, Microelectronic Engineering, accepted for publication.

3. H. Ymeri, B. Nauwelaers, K. Maex, Simple and accurate analysis of interconnects in high speed integrated circuits, J. Phys. D, to be published.

4. Fast parameter extraction of general interconnects using geometry independent measured equation of invariance;Sun;IEEE Trans. Microwave Theory Technol.,1997

5. Computation of capacitance matrix for integrated circuit interconnects using on-surface MEI method;Liu;IEEE Microwave Guided Wave Lett.,1999

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the frequency-dependent line admittance of VLSI interconnect lines on silicon-based semiconductor substrates;Microelectronics Journal;2002-05

2. On the frequency‐dependent line capacitance and conductance of on‐chip interconnects on lossy silicon substrate;Microelectronics International;2002-04-01

3. On the modelling of multiconductor multilayer systems for interconnect applications;Microelectronics Journal;2001-04

4. Simple and efficient approach for shunt admittance parameters calculations of VLSI on-chip interconnects on semiconducting substrate;Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition

5. New analytic expressions for mutual inductance and resistance of coupled interconnects on lossy silicon substrate;2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496)