Testing asynchronous circuits: A survey-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Testing asynchronous circuits: A survey

Published:1995-11 Issue:3 Volume:19 Page:111-131
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Hulgaard Henrik,Burns Steven M.,Borriello Gaetano

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference43 articles.

1. The design of an asynchronous microprocessor;Martin,1989

2. A self-timed chip for division;Williams,1987

3. A family of routing and communication chips based on the Mosaic;Seitz,1993

4. Digital Systems Testing and Testable Design;Abromovici,1990

5. Switching and Finite Automata Theory, Computer Science Series;Kohavi,1978

Cited by 34 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements;Journal of Electronic Testing;2024-07-22

2. Analysis of State Corruption caused by Permanent Faults in WCHB-based Quasi Delay-Insensitive Pipelines;2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2021-04-07

3. Data Flow Obfuscation: A New Paradigm for Obfuscating Circuits;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-04

4. On the Effects of Permanent Faults in QDI Circuits - A Quantitative Perspective;2020 IEEE 38th International Conference on Computer Design (ICCD);2020-10

5. Sensitive, Linear, Robust Current-To-Time Converter Circuit for Vehicle Automation Application;Electronics;2020-03-16

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP