Electron and helium ion yield XAFS of sputter-deposited iron silicide thin films
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Electron-yield extended x-ray absorption fine structure with the use of a gas-flow electron detector
2. Electron yield X ray absorption spectroscopy at atmospheric pressure
3. A gas-flow electron yield detector for glancing-incidence EXAFS
4. A low-temperature gas-flow total electron yield detector for XAFS measurements
5. Electron Yield XAFS Study of Evaporated Co/Pd Multilayers with Various Thickness Ratios of Co to Pd Sublayers: Simulations of the Co K-edge XAFS and Fourier Transforms
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. EuK-XAFS of europium dioxymonocyanamide with the conversion He+ion yield method;Journal of Synchrotron Radiation;1999-05-01
2. Conversion Electron/He Ion Yield XAFS of SrTiO3Thin Films;Japanese Journal of Applied Physics;1999-01-01
3. Crystal and Electronic Structures and the Corrosion Resistance for Metal Nitrides in the TiN-AIN System;Le Journal de Physique IV;1997-04
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