X-ray scattering studies of surface roughness of GaAs/A1As multilayers-Reference-Cited by-同舟云学术

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X-ray scattering studies of surface roughness of GaAs/A1As multilayers

Published:1994-04 Issue:1-3 Volume:198 Page:72-77
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Sinha S.K.,Sanyal M.K.,Satija S.K.,Majkrzak C.F.,Neumann D.A.,Homma H.,Szpala S.,Gibaud A.,Morkoc H.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference12 articles.

1. Surface Studies of Solids by Total Reflection of X-Rays

2. Interfacial roughness correlation in multilayer films: Influence of total film and individual layer thicknesses

3. Neutron scattering by rough surfaces at grazing incidence

4. Reflectivity using neutrons or X-rays? A critical comparison

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