On noise and random telegraph noise in very small electronic devices
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency (1f?) Noise
2. 1/fand random telegraph noise in silicon metal‐oxide‐semiconductor field‐effect transistors
3. Anomalous telegraph noise in small-area silicon metal-oxide-semiconductor field-effect transistors
4. Individual oxide traps as probes into submicron devices
5. Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise
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