Author:
Tanaka K.,Mori Y.,Yamagiwa H.,Abo S.,Wakaya F.,Takai M.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. H. Yamagiwa, S. Abo, F. Wakaya, T. Sakamoto, H. Tokioka, N. Nakagawa, M. Takai. in: Abstract of the 12th International Display Workshops in Conjunction with Asia Display 2005, Takamatsu, Japan, December 6–9, 2005.
2. Local resistance measurement across grain boundaries in low-temperature polycrystalline silicon layer of thin film transistor using scanning spreading resistance microscopy
3. Just‐on‐surface magnetic force microscopy
4. Quantification of magnetic force microscopy using a micronscale current ring
5. Mapping electron flow using magnetic force microscopy
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