Author:
Romanus H.,Schadewald J.,Cimalla V.,Niebelschütz M.,Machleidt T.,Franke K.-H.,Spiess L.,Ambacher O.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. T. Hausotte, G. Jäger, E. Manske, N. Hofmann, N. Dorozhovets, in: Proceedings of SPIE 5878, Optics and Photonics, San Diego, CA, USA, 2005.
2. Morphological estimation of tip geometry for scanned probe microscopy
3. Proceedings of the Nanoscale 2004;Machleidt,2005
4. Anwendung der FIB für Materialwissenschaft und Fehleranalyse / Using FIB for Materials Science and Failure Analysis
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献