Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Y. Taur, L.H. Wann, D.J. Frank, 25 nm CMOS design considerations, in: IEDM Tech. Dig., 1998, pp. 789–792
2. CMOS scaling into the nanometer regime
3. Device scaling limits of Si MOSFETs and their application dependencies
4. Y. Taur, in: Proc. Symp. VLSI Technology, pp. 6–9, 1999
5. Generalized guide for MOSFET miniaturization
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