Subthreshold read operations in 3D PCM: 1S1R device modeling and memory array analysis

Author:

Yu Qiuyao,Zhang Guangming,Lei Yu,Yang Xinyu,Chen Houpeng,Wang Qian,Song Zhitang

Publisher

Elsevier BV

Reference36 articles.

1. High endurance phase change memory chip implemented based on carbon-doped Ge2Sb2Te5 in 40 nm node for embedded application;Song,2018

2. 3D cross-point phase-change memory for storage-class memory;Cheng;J. Phys. D-Appl. Phys.,2019

3. Memristive technologies for data storage, computation, encryption, and radio-frequency communication;Lanza;SCIENCE,2022

4. Innovative PCM plus OTS device with high sub-threshold non-linearity for non-switching reading operations and higher endurance performance;Navarro,2017

5. Design space exploration of ovonic threshold switch (OTS) for sub-threshold read operation in cross point memory arrays;Woo,2019

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