Author:
Richard O.,Iacopi F.,Bender H.,Beyer G.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Electron Energy-Loss Spectroscopy in the Electron Microscope;Egerton,1996
2. The resolution limit for elemental mapping in energy-filtering transmission electron microscopy
3. O. Richard, F. Iacopi, Zs. To˝kei, H. Bender, in: Proceedings of Microscopy of Semiconducting Materials, Oxford, Springer Proceedings in Physics 107 (2005) 347.
4. H. Bender, O. Richard, P. Van Marcke, C. Drijbooms, in: Proceedings of Microscopy of Semiconducting Materials, Oxford, Springer Proceedings in Physics 107 (2005) 397.
5. F. Iacopi, O. Richard, J. Van Aelst, G. Mannaert, V.V. Talanov, A. Scherz, A.R. Schwartz, H. Bender, Y. Travaly, S.H. Brongersma, G.A. Antonelli, M. Moinpour, G. Beyer, in: Proceedings of IEEE International Interconnect Technology Conference, San Francisco, 2006, 12.
Cited by
23 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献