1. Spontaneous polarization and piezoelectric constants of III-V nitrides
2. A correlation of capacitive RF-MEMS reliability to AlN dielectric film spontaneous polarization
3. T. Lisec, C. Huth, B. Wagner, Dielectric material impact on capacitive RF MEMS reliability, Conference Proceedings of 34th European Microwave Week (1), (2004) The Netherlands, 73–76.
4. M. Fernandez-Bolanos, D. Tsamados, P. Dainesi, A.M. Ionescu, Reliability of RF MEMS capacitive switches and distributed MEMS phase shifters using AlN dielectric, Proceedings of the 22nd IEEE International Conference on Micro Electro Mechanical Systems (MEMS), (2009), Italy, art. No. 4805463, 638–641.