A novel fault tolerant majority gate in quantum-dot cellular automata to create a revolution in design of fault tolerant nanostructures, with physical verification-Reference-Cited by-同舟云学术

A novel fault tolerant majority gate in quantum-dot cellular automata to create a revolution in design of fault tolerant nanostructures, with physical verification

Published:2018-05 Issue: Volume:192 Page:52-60
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Hosseinzadeh Hassan,Heikalabad Saeed Rasouli^ORCID

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference37 articles.

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5. Logical devices implemented using quantum cellular automata;Lent;Appl. Phys.,1994

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3. Towards nanoscale fault-tolerant logical circuits using proposed robust majority voter in quantum-dot cellular automata technology;Nano Communication Networks;2023-12

4. An ultra-efficient design of fault-tolerant 3-input majority gate (FTMG) with an error probability model based on quantum-dots;Computers and Electrical Engineering;2023-09

5. Defects of quantum dot cellular automata computing devices: An extensive review, evaluation, and future directions;Microprocessors and Microsystems;2023-09