Drying process of an ink-dot analyzed using both digital holographic microscopy and tackiness measurement-Reference-Cited by-同舟云学术

Drying process of an ink-dot analyzed using both digital holographic microscopy and tackiness measurement

Published:2021-03 Issue: Volume:241 Page:111543
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Yokota Masayuki,Aoyama Fumiya

Funder

Ministry of Education, Culture, Sports, Science and Technology

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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3. Chromatographic and electrophoretic approaches in ink analysis;Zlotnick;J. Chromatogr. B,1999

4. Contact angle and wetting properties;Yuan,2013

5. Some new observations on line tension of microscopic droplets;Stockelhuber;Colloids Surf. A Physicochem. Eng. Asp.,1999

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1. Two-wavelength digital holography using frequency-modulated continuous-wave technique for multiplexing in the time–frequency domain;Optical Review;2023-10-05

2. Two-wavelength digital holography using frequency-modulated continuous-wave technique for multiplexing in the time-frequency domain;OPT REV;2023

3. TACK REDUCTION;Handbook of Surface Improvement and Modification;2023

4. Drying Process of Ink Dot Analyzed by Using Digital Holographic Microscope;Journal of the Japan Society of Colour Material;2022-10-20

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