Digital holography as metrology tool at micro-nanoscale for soft matter-Reference-Cited by-同舟云学术

Digital holography as metrology tool at micro-nanoscale for soft matter

Published:2022 Issue:1 Volume:3 Page:151
ISSN:2831-4093
Container-title:Light: Advanced Manufacturing
language:
Short-container-title:gxjzz

Author:

Wang Zhe,Miccio Lisa,Coppola Sara,Bianco Vittorio,Memmolo Pasquale,Tkachenko Volodymyr,Ferraro Vincenzo,Maio Ernesto Di,Maffettone Pier Luca,Ferraro Pietro

Publisher

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Link

https://www.light-am.com/article/pdf/preview/10.37188/lam.2022.010.pdf

Reference137 articles.

1. Stetson, K. A. & Powell, R. L. Interferometric hologram evaluation and real-time vibration analysis of diffuse objects. Journal of the Optical Society of America 55, 1694-1695 (1965).

2. Rastogi, P. K. Holographic Interferometry: Principles and Methods. (Berlin: Springer, 2013).

3. Goodman, J. W. & Lawrence, R. W. Digital image formation from electronically detected holograms. Applied Physics Letters 11, 77-79 (1967).

4. Schnars, U. & Jüptner, W. Direct recording of holograms by a CCD target and numerical reconstruction. Applied Optics 33, 179-181 (1994).

5. Singh, V. R. & Asundi, A. In-line digital holography for dynamic metrology of MEMS. Chinese Optics Letters 7, 1117-1122 (2009).

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