Biomolecular layer thickness evaluation using White Light Reflectance Spectroscopy-Reference-Cited by-同舟云学术

Biomolecular layer thickness evaluation using White Light Reflectance Spectroscopy

Published:2010-05 Issue:5-8 Volume:87 Page:802-805
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Kitsara M.,Petrou P.,Kontziampasis D.,Misiakos K.,Makarona E.,Raptis I.,Beltsios K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Analysis of Protein Aggregation in Sub-Femtoliter Volume by Two-Photon-Based Fluorescence Correlation Spectroscopy

2. Study on orientation of immunoglobulin G on protein G layer

3. Dynamic adsorption of monoclonal antibody layers on hydrophilic silica surface: A combined study by spectroscopic ellipsometry and AFM

4. Adsorption and Bioactivity of Protein A on Silicon Surfaces Studied by AFM and XPS

5. TM-AFM Threshold Analysis of Macromolecular Orientation: A Study of the Orientation of IgG and IgE on Mica Surfaces

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