Author:
Park Segeun,Kim Ilgweon,Park Yongjik,Choi Joosun,Roh Yonghan
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Se Geun Park et al., International Conference on Solid State Devices and Materials (2005), 624–625.
2. H.J. Oh et al., European Device Solid-State Research Conference (2005), 177–180.
3. Anode hole injection and trapping in silicon dioxide
4. Tze Kiong Ng et al., International Integrated Reliability Workshop Final Report (2004), 148–150.
5. Impact of gate-poly grain structure on the gate-oxide reliability [CMOS]
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献