Investigation of isothermal aged Sn-3Ag-0.5Cu/Sn58Bi-Co hybrid solder joints on ENIG and ENEPIG substrate with various mechanical performances

Author:

Zhang Shuai,Qiu Qingyang,Ding Tianran,Long Weimin,Zhong Sujuan,Paik Kyung-Wook,He Peng,Zhang Shuye

Publisher

Elsevier BV

Reference32 articles.

1. Forming mechanism and growth of Kirkendall voids of Sn/Cu joints for electronic packaging: a recent review;Wang;J. Adv. Join. Process.,2022

2. Effect of electric current stressing on mechanical performance of solders and solder joints: a review;Wang;J. Mater. Sci.,2022

3. Challenges and recent prospectives of 3D heterogeneous integration;Zhang;E-Prime - Adv. Electr. Eng., Electron. Energy,2022

4. Recent advances in nano-materials for packaging of electronic devices;Zhang;J. Mater. Sci.: Mater. Electron.,2019

5. The design of low-temperature solder alloys and the comparison of mechanical performance of solder joints on ENIG and ENEPIG interface;Wang;J. Mater. Res. Technol.,2023

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