High performance thermography with InGaAs photon counting camera

Author:

Bascoul G.,Perdu P.,Beguin M.,Lewis D.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Park J, Diestel S, Richman S, Chen F, Mooney J, Escobar D, Sato D, Lee CC, Media Y. Hot spot measurement on CMOS-based image sensor using liquid crystal thermograph. In: Proceedings 52nd electronics components and technology conference; 2002. p. 1627–30

2. Application of computer-based thermography to thermal measurements of integrated circuits and power devices;Grecki;Microelectron J,1997

3. Scanning thermal microscopy;Majumdar;Ann Rev Mater Sci,1999

4. Optical ammeter for integrated circuit characterization and failure analysis;Claeys;Qual Reliab Eng Int,1995

5. Breitenstein O, Warta W, Langenkamp M. Lock-in thermography, basics and use for evaluating electronic devices and materials. 2nd ed., vol. 10. Springer Series in Advanced Microelectronics; 2010 [ISBN 978-3-642-02416-0].

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