Analysis and validation of neural network approach for extraction of small-signal model parameters of microwave transistors-Reference-Cited by-同舟云学术

Analysis and validation of neural network approach for extraction of small-signal model parameters of microwave transistors

Published:2013-03 Issue:3 Volume:53 Page:414-419
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Marinković Zlatica,Ivković Nenad,Pronić-Rančić Olivera,Marković Vera,Caddemi Alina

Funder

Ministarstvo Prosvete, Nauke i Tehnološkog Razvoja

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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3. A functional GaAs FET noise model;Podell;IEEE Trans Electron Dev,1981

4. Noise modeling in submicrometer-gate two-dimensional electron-gas field-effect transistors;Cappy;IEEE Trans Electron Dev,1985

5. A new method for determining the FET small signal equivalent circuit;Dambrine;IEEE Trans Microw Theory Technol,1988

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