Lifetime predictions of LED-based light bars by accelerated degradation test-Reference-Cited by-同舟云学术

Lifetime predictions of LED-based light bars by accelerated degradation test

Published:2012-07 Issue:7 Volume:52 Page:1332-1336
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Wang Fu-Kwun,Chu Tao-Peng

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. Characterizing white LEDs for general illumination applications;Narendran;Proc SPIE,2000

5. Designing optimal degradation tests via multi-objective genetic algorithms;Marseguerra;Reliab Eng Syst Saf,2003

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