Author:
Ortiz-Conde Adelmo,García-Sánchez Francisco J.,Muci Juan,Terán Barrios Alberto,Liou Juin J.,Ho Ching-Sung
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference102 articles.
1. Analysis and design of MOSFETs: Modeling, Simulation and Parameter Extraction;Liou,1998
2. An overview of parameter extraction in field effect transistors;Ortiz-Conde;Acta Científica Venezolana,2000
3. A review of recent MOSFET threshold voltage extraction methods;Ortiz-Conde;Microelectron Reliab,2002
4. Comparison of MOSFET-threshold-voltage extraction methods;Terada;Solid-State Electron,2001
5. Understanding threshold voltage in undoped-body MOSFETs: an appraisal of various criteria;Garcia-Sánchez;Microelectron Reliab,2006
Cited by
199 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献