Effect of 805 nm on reliability of 735/805/850-nm LED involved near-infrared spectroscopy biomedical device-Reference-Cited by-同舟云学术

Effect of 805 nm on reliability of 735/805/850-nm LED involved near-infrared spectroscopy biomedical device

Published:2017-11 Issue: Volume:78 Page:406-410
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Zhao Yue,Qiu Lina,Zhao Ke,Li Kai,Sun Yunlong,Meng Lingkang,Huang Zhe,Li Ting

Funder

One University One Zone Growth Fund

Fundamental Research Funds for the Central Universities

National Natural Science Fund Projects

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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