Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. Characterization of soft errors caused by single event upsets in CMOS processes;Karnik;IEEE Trans. Dependable Secure Comput.,2004
2. Faults, injection methods, and fault attacks;Kim;IEEE Des. Test Comput.,2007
3. Fault injection attacks on cryptographic devices: theory, practice, and countermeasures;Barenghi;Proc. IEEE,2012
4. Which concurrent error detection scheme to choose?;Mitra,2000
5. Error Detecting Logic for Digital Computers;Sellers,1968
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