Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies;Voldman;Microelectron. Reliab.,2001
2. Advanced SCR ESD Protection Circuits for CMOS/SOI Nanotechnologies;Mergens,2005
3. SCR device with dynamic holding voltage for on chip ESD protection in a 0.25μm fully salicided CMOS process;Ker;IEEE Trans. Electron Devices,2004
4. A dual base triggered SCR with very low leakage current and adjustable trigger voltage;Sarro,2008