1. European Cooperation for Space Standardization;ECSS,2017
2. Failure Mechanisms and Models for Semiconductor Devices, 122;JEDEC Publication,2016
3. Failure Mechanism Based Stress Test Qualification for integrated Circuits;AEC Q100;Rev. G, 2007, and Rev. H,2014
4. Failure Mechanism Based Stress Test Qualification for Discrete Semiconductors in Automotive Applications, Rev D1;AEC Q101,2013
5. Qualification Requirements for Components Using Copper Wire Interconnections;AEC Q006,2015