Electronic Components Authentication via Physical Analysis
Author:
Affiliation:
1. University of Cagliari,Department of Electrical and Electronic Engineering,Cagliari,Italy,09123
2. University of Cagliari,Department of Physics,Monserrato,Italy,09042
Funder
Fondazione di Sardegna
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10315714/10315787/10315874.pdf?arnumber=10315874
Reference18 articles.
1. Failure Analysis of Failure Analyses: The Rules of the Rue Morgue, Ten Years Later
2. Microelectronics Failure Analysis
3. Automotive electronics in space: combining the advantages of high reliability components with high production volume
4. Raman Spectroscopic Study of Counterfeit Electronic Components;vaskova;WSEAS Trans on Systems and Control,2018
5. Failure Analysis of Integrated Circuits: Tools and Techniques L.C. Wagner, “Failure analysis of integrated circuits: tools and techniques;wagner;Kluwer Academic Publishers,1999
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