Applications of fracture mechanics to quantitative accelerated life testing of plastic encapsulated microelectronics

Author:

Evans John W.,Sinha Koustav

Funder

NASA

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference34 articles.

1. Area Array Interconnection Handbook;Puttlitz,2001

2. Polymer adhesives and encapsulants for microelectronic applications;Benson;Johns Hopkins APL Technical Digest,2008

3. Electronic Materials and Properties, Electronic Packaging Handbook;Evans,1991

4. Influence of temperature and humidity on adhesion of underfills for flip chip packaging;Luo;IEEE Transactions on Components and Packaging Technologies,2005

5. Understanding the strength of epoxy-polyimide interfaces for flip-chip packages;Hoontrakul;IEEE Transactions on Device and Materials Reliability,2003

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