Design for reliability of generic sensor interface circuits

Author:

Heinssen Sascha,Hillebrand Theodor,Taddiken Maike,Tscherkaschin Konstantin,Paul Steffen,Peters-Drolshagen Dagmar

Funder

Federal Ministry of Education and Research, Germany

Focusproject AkoSS, University of Bremen

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference50 articles.

1. Hot Carrier Degradation in Semiconductor Devices;Grasser,2015

2. Bias Temperature Instability for Devices and Circuits;Grasser,2013

3. The Art of Analog Layout;Hastings,2006

4. Using Operating Point-Dependent Degradation and gm/Id Method for Aging-Aware Design;Hellwege,2013

5. AAS-Maps: aging-aware sensitivity-maps for reliability driven analog circuit design;Hellwege,2014

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