1. Hot Carrier Degradation in Semiconductor Devices;Grasser,2015
2. Bias Temperature Instability for Devices and Circuits;Grasser,2013
3. The Art of Analog Layout;Hastings,2006
4. Using Operating Point-Dependent Degradation and gm/Id Method for Aging-Aware Design;Hellwege,2013
5. AAS-Maps: aging-aware sensitivity-maps for reliability driven analog circuit design;Hellwege,2014