Stochastic behavioral models for system level reliability analysis including non-normal and correlated process variation-Reference-Cited by-同舟云学术

Stochastic behavioral models for system level reliability analysis including non-normal and correlated process variation

Published:2021-03 Issue: Volume:118 Page:114044
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Taddiken Maike,Hillebrand Theodor,Peters-Drolshagen Dagmar,Paul Steffen

Funder

Deutsche Forschungsgemeinschaft

Bundesministerium für Bildung und Forschung

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Analog IC Reliability in Nanometer CMOS;Maricau,2013

2. Hot Carrier Degradation in Semiconductor Devices,2015

3. Design for reliability of generic sensor interface circuits;Heinssen;Microelectron. Reliab.,2018

4. Variability-aware reliability simulation of mixed-signal ics with quasi-linear complexity;Maricau,2010

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