1. Climatic reliability of electronic devices and components;Ambat;SMT Surf. Mt. Technol. Mag.,2014
2. Surface Insulation Resistance, Fluxes, IPC-TM-650, Test method 2.6.3.3, IPC,2004
3. Electrochemical Migration Resistance Test, IPC-TM-650, Test method 2.6.14.1, IPC,2000
4. Corrosion, Flux, IPC-TM-650 Test method 2.6.15, IPC,2004
5. Flux Induced Corrosion (Copper Mirror Method), IPC-TM-650 Test method 2.3.32, IPC,2004