Reliability study of fiber-coupled photodiode module for operation at 4 K-Reference-Cited by-同舟云学术

Reliability study of fiber-coupled photodiode module for operation at 4 K

Published:2018-02 Issue: Volume:81 Page:362-367
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Bardalen Eivind,Karlsen Bjørnar,Malmbekk Helge,Akram Muhammed Nadeem,Ohlckers Per

Funder

European Union

Norwegian Ministry of Education and Research

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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