Author:
Roth N.,Wondrak W.,Willikens A.,Hofmeister J.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Hofmeister JP, Lall P, Graves Russ. In-situ, real-time detector for faults in solder joints belonging to operational, fully programmed FPGAs. In: Proceedings, IEEE AUTOTESTCON 2006, Anaheim, CA, September 18–21, 2006. p. 237–43.
2. Hofmeister JP, Lall P, Graves R. In-situ, real-time detector for faults in solder-joint networks belonging to operational, fully programmed field programmable gate arrays (FPGAs). In: IEEE instrumentation and measurement magazine, August, 2007. p. 32–7.
3. Pradeep Lall, Prakriti Choudhary, Sameep Gupte, Jeff Suhling, James Hofmeister, Justin Judkins, Douglas Goodman. Statistical pattern recognition and built-in reliability test for feature extraction and health monitoring of electronics under shock loads. In: 57th IEEE electronic components and technology conference, June 1, 2007.
4. James P, Hofmeister, Pradeep Lall, Edgar Ortiz, Jeremy Ralston-Good, Douglas Goodman. Prognostic solder-joint sensors for programmed FPGAs. In: CMSE conference 2007, Components Technology Institute Inc., Los Angeles, CA., March 12–15, 2007. p. 159–68.
5. James P. Hofmeister, Pradeep Lall, Edgar Ortiz, Doug Goodman, Justin Judkins. Real-time detection of solder-joint faults in operational field programmable gate arrays. In: IEEE aerospace conference 2007, Big Sky, MT, March 4–9, 2007, Track 11-0908. p. 1–9.
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