Failure of the negative voltage regulator in medium-photon-energy X radiation fields

Author:

Vukić Vladimir Dj.,Osmokrović Predrag V.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Influence of a Coupling Diode on the Indirect Characterization of the Serial NPN Power Transistor in a Linear Voltage Regulator Exposed to Ionizing Radiation;Journal of Circuits, Systems and Computers;2024-08-28

2. An Application of the SpekCalc Software Tool for Dosimetric Calculations in Linear Integrated Circuits Operating in Arbitrary Bremsstrahlung Environments;2024 11th International Conference on Electrical, Electronic and Computing Engineering (IcETRAN);2024-06-03

3. Mathematical Modelling of the Leakage Path Resistance in a Power Bipolar Integrated Circuit Exposed to X-Ray Radiation;2024 11th International Conference on Electrical, Electronic and Computing Engineering (IcETRAN);2024-06-03

4. Short-term Recovery Effect in a Power Integrated Circuit Exposed to X-Rays;2023 IEEE 33rd International Conference on Microelectronics (MIEL);2023-10-16

5. Characterization of the Serial NPN Power Transistor in a Negative Voltage Regulator Operating in Various X-Ray Environments;2023 IEEE 33rd International Conference on Microelectronics (MIEL);2023-10-16

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