Author:
Rampnoux J.M.,Michel H.,Salhi M.A.,Grauby S.,Claeys W.,Dilhaire S.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging;Grauby;IEEE Electron Device Letters,2005
2. Full-field optical coherence microscopy;Beaurepaire;Optics Letters,1998
3. Grauby S. Imagerie photothermique de photoréflectance haute fréquence utilisant une caméra CCD visible couplée à une détection synchrone multiplexée. Thesis, FR, 2000.
4. Applications of temperature phase measurements to IC testing;Altet;Microelectronics Reliabihty,2004
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