Author:
Krieger V.,Wondrak W.,Dehbi A.,Bartel W.,Ousten Y.,Levrier B.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference3 articles.
1. The use of impedance spectroscopy;Ousten;SEM and SAM imaging for early detection of failure in SMT assemblies Microelectronics Reliability,1998
2. Pechloff M. www.epcos.com (2006).
3. Ousten Y, Levrier B, Verdier F. Reliability analysis of ceramic capacitors under 200 °C CARTS 2004 Nice (France).
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12 articles.
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