1. Menozzi R. Dipartimento di Ingegneria dell’Informazione, Universita’ di Parma, Private e-mail November 24, 2004, complied from history of the GaAs reliability workshop—called the ROCS workshop after 2003.
2. Stork H. Reliability challenges for sub-100nm system on chip technologies, Keynote address. In: International reliability physics symposium (IRPS), 2004.
3. Lifetesting GaAs MMICs under RF stimulus;Roesch;IEEE Trans Microw Theory Tech,1992
4. Chou YC. et al. On the investigation of gate metal interdiffusion in GaAs HEMTs. In: GaAs IC symposium, 2003. p. 63–6.
5. Roesch W, Stunkard D. Proving GaAs reliability with IC element testing. In: US conference on GaAs manufacturing technology, 1988. p. 91–5.