Author:
Entringer Christophe,Flatresse Philippe,Galy Philippe,Azais Florence,Nouet Pascal
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Thermal Failure in Semiconductor Devices;Dwyer;Solid States Electronics,1990
2. Raha P, Smith JC, Miller JW, Rosenbaum E. Prediction of ESD Protection Levels and Novel Protection Devices in Thin Film SOI Technology. EOS/ESD Symposium 1997;356–65.
3. Reyboz M, Daviot R, Rozeau O, Martin P, Paccaud M. Compact Modeling of the Self Heating Effect in 120nm Multifinger Body-Contacted SOI MOSFET for RF Circuits. IEEE International SOI Conference 2004;159–61.
4. Christophe Entringer, Philippe Flatresse, Pascal Salome, Pascal Nouet and Florence Azais “Physics and Design Optimization of ESD diode for 0.13um PD-SOI Technology”, EOS/ESD symposium, p. 53–9. 2005.
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