Author:
Crunteanu A.,Pothier A.,Blondy P.,Dumas-Bouchiat F.,Champeaux C.,Catherinot A.,Tristant P.,Vendier O.,Drevon C.,Cazaux J.L.,Marchand L.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
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2. Schwartz RN, et al. Proceedings of the 2000 IEEE Microelectronics Reliability and Qualification Workshop, Oct. 2000, paper IV.6.
3. A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
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