Exploiting component dependency for accurate and efficient soft error analysis via Probabilistic Graphical Models-Reference-Cited by-同舟云学术

Exploiting component dependency for accurate and efficient soft error analysis via Probabilistic Graphical Models

Published:2015-01 Issue:1 Volume:55 Page:251-263
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jiao Jiajia,Juan Da-Cheng,Marculescu Diana,Fu Yuzhuo

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. Transient fault models and AVF estimation revisited;George;Dependable Syst Networks,2010

5. A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor;Mukherjee;MICRO-36,2003

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