Author:
Pralgauskaitė Sandra,Palenskis Vilius,Matukas Jonas,Glemža Justinas,Muliuk Grigorij,Šaulys Bronius,Trinkūnas Augustinas
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference41 articles.
1. Akbulut M, Chen CH, Hargis M, Weiner AM, Melloch MR, Woodall JM. Digital communications using 890-nm surface-emitting light-emitting diodes above 1 Gbit/s. In: IEEE proc. conf. on lasers and electro-optics (CLEO 2000); 2000. P. 509–10.
2. Liu L, Yang J, Wang G. The investigation of LED’s reliability through highly accelerated stress testing methods. In: IEEE proc. conf. electronic materials and packaging (EMAP); 2012. p. 1–3.
3. Cai M, Yang DG, Koh S, Yuan CA, Chen WB, Wu BY, Zhangl GQ. Accelerated testing method of LED luminaries. In: IEEE proc. conf. thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (EuroSimE); 2012. p. 1/8–8/8.
4. Sutharssan T, Bailey C, Stoyanov S. A comparison study of the prognostics approaches to light-emitting diodes under accelerated aging. In: IEEE proc. conf. thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (EuroSimE); 2012. p. 1/6–6/6.
5. Analysis of contributing factors for determining the reliability characteristics of GaN-based white light-emitting diodes with dual degradation kinetics;Jung;IEEE Trans Electron Dev,2013
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献