Reliability investigation of light-emitting diodes via low frequency noise characteristics

Author:

Pralgauskaitė Sandra,Palenskis Vilius,Matukas Jonas,Glemža Justinas,Muliuk Grigorij,Šaulys Bronius,Trinkūnas Augustinas

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference41 articles.

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2. Liu L, Yang J, Wang G. The investigation of LED’s reliability through highly accelerated stress testing methods. In: IEEE proc. conf. electronic materials and packaging (EMAP); 2012. p. 1–3.

3. Cai M, Yang DG, Koh S, Yuan CA, Chen WB, Wu BY, Zhangl GQ. Accelerated testing method of LED luminaries. In: IEEE proc. conf. thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (EuroSimE); 2012. p. 1/8–8/8.

4. Sutharssan T, Bailey C, Stoyanov S. A comparison study of the prognostics approaches to light-emitting diodes under accelerated aging. In: IEEE proc. conf. thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (EuroSimE); 2012. p. 1/6–6/6.

5. Analysis of contributing factors for determining the reliability characteristics of GaN-based white light-emitting diodes with dual degradation kinetics;Jung;IEEE Trans Electron Dev,2013

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