Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits-Reference-Cited by-同舟云学术

Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits

Published:2015-01 Issue:1 Volume:55 Page:238-250
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Bany Hamad Ghaith,Hasan Syed Rafay,Ait Mohamed Otmane,Savaria Yvon

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference35 articles.

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5. Holcomb D, Li W, Seshia SA. Design as you see fit: systemlevel soft error analysis of sequential circuits. In: Proceedings of the IEEE/ACM international conference on design, automation and test in Europe (DATE), 2009.

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