Accelerated life time testing and optical degradation of remote phosphor plates

Author:

Yazdan Mehr M.,van Driel W.D.,Zhang G.Q.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

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2. Light emitting diodes reliability review;Chang;Microelectron Rel,2012

3. Stability and performance evaluation of high-brightness light-emitting diodes under DC and pulsed bias conditions;Meneghini;Proc SPIE,2006

4. Accelerated life test of high brightness light emitting diodes;Trevisanello;IEEE Trans Dev Mater Rel,2008

5. High temperature electro-optical degradation of InGaN/GaN HBLEDs;Meneghini;Microelectron Rel,2007

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